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    HIRSCH CHIZEVER

    RCS MEASUREMENTS

    ANTENNA MEASUREMENTS

    MATERIAL MEASUREMENTS

    7 COURSES

    In 7 courses, Dr. Hirsch Chizever condenses 40 years of hands-on experience gained through the primary development years of electromagnetic measurement science.

    4 DAYS

    Each 4-day course distills essential trade craft techniques to people who make RF measurements critical to flight systems or those who must skilfully plan for RF tests and acquire necessary resources.

    Course Catalogue

    Course Description

    Course Topics

    Education

    Experience

    Government & Industry

    Publications

    Course Description

    Delta Sigma has taken decades of hands-on experience and distilled out essential tradecraft in a training series designed for people who make RF measurements critical to flight systems or those who must skillfully plan for RF tests and acquire necessary resources.

    DSC’s own Dr. Hirsch Chizever has 40 years of experience in making complex RCS, antenna, and materials measurements.  Much of that time was spent at the Air Force Research Laboratory (AFRL) in Dayton, Ohio, advancing state-of-the-art RF measurements for Low Observability, guidance systems, and other fields. Dr. Chizever’s understanding of electromagnetics and decades of in-the-lab and in-the-range experience allows him to deliver practical information to those wishing to rapidly advance their knowledge of measurement science.

    Each of these 4-day courses will provide the student with tradecraft that would take years to acquire through experience alone – indeed, the information presented is the key elements on the topic resulting from decades of hands-on experience.

      •  What is RCS and why is it significant?
      •  Basic Scattering Theory
      •  Measuring RCS
      •  Test Matrix Development
      •  RF Measurement Hardware
      •  Calibration Methods
      •  Target mounting schemes
      •  Data Presentations
      •  Measurement Errors and Mitigation Schemes

      •  What antenna characteristics are relevant?
      •  Basic Antenna Theory
      •  Measuring Antenna Gain,
      •  Beamwidth, VSWR, and Phase Center
      •  Test Matrix Development
      •  RF Measurement Hardware
      •  Calibration Methods
      •  Antenna mounting schemes
      •  Data Presentations
      •  Measurement Errors and Mitigation Schemes

      •  What RF Material Parameters are Relevant and How They're Used. 
      •  Basic Theory of Electrical Permittivity and Magnetic Permeability
      •  Methods of Measuring Permittivity and Permeability
      •  Test Matrix Development
      •  RF Measurement Hardware
      •  Data Presentations
      •  Measurement Errors and Mitigation Schemes

      •  Selecting chamber size and shape
      •  Absorber selection
      •  Reflector options
      •  Feed antennas
      •  Target positioning
      •  Target handling
      •  HVAC and Fire Protection

      •  Field Probe Measurements
      •  Flat Plate Measurements
      •  Offset Cylinder Measurements
      •  Chamber VSWR Measurements
      •  Angle-of-Arrival/Time-of-Arrival Processing
      •  RF Stability Measurements

      •  Fourier Transform
      •  Basic Filter Theory
      •  Gating
      •  Range Processing
      •  Doppler Processing
      •  ISAR Imaging

      •  Image-Edit-Reconstruction
      •  Super Resolution Techniques
      •  Tomography
      •  Physical Basis Functions

    Education

    Hirsch Chizever received the B.S. degree from the University of Evansville, Evansville, Indiana, in 1985, the M.S. degree from the University of Dayton, Dayton, Ohio, in 1995, and the Ph.D. degree from The Air Force Institute of Technology, Wright Patterson Air Force Base, Ohio, in 2021, all in electrical engineering. Since 1982, Dr. Chizever has specialized in tradecraft associated with RCS, antenna, and material measurement techniques, signal processing tools, and measurement range development and operations.

    Professional Experience

    Summary of Professional Qualifications:

    RF measurement techniques, signal exploitation, and large-scale RF system integration.
    Critical project experience includes:

      •  RCS, antenna, and material measurements
      •  Anisotropic material inversions
      •  LO technologies and applications
      •  RF Measurement Facilities:
         ➢ Design, construction, and operation
         ➢ Error characterization and mitigation
         ➢ NIST Certification
      •  RF calibration schemes
      •  Test body design/implementation
      •  Active weapon system RF forensics
      •  Mobile RF measurement systems
      •  SAR imagery algorithms
      •  Monostatic and bistatic scenarios
      •  RF tagging and phase encoding
      •  Super-resolution techniques
      •  Air-to-ground radar simulations
      •  Clutter rejection methods
      •  Radar target recognition
      •  Hardware-in-the-Loop (HIL) Measurements

    Government and Industry

    2022 – Present  Delta Sigma Company
    2010 – 2022        ARA/Applied Electromagnetics Division, Dayton, OH
    1989 – 2003        Mission Research Corporation, Dayton, OH
    1982 – 1989         US Department of Defense, Wright Patterson AFB and Pacific Missile Test Center

    Publications

    Peer-Reviewed Journal Publications

    • H. M. Chizever, P. J. Collins and M. J. Havrilla, “Permittivity Estimates of Dielectric Spheres Using

    Radar Scattering Measurements,” in IEEE Sensors Letters, vol. 5, no. 8, pp. 1-4, Aug. 2021, Art no. 7003004, doi: 10.1109/LSENS.2021.3098435.

    • R. Ruh and H. Chizever, (1998), Permittivity and Permeability of Mullite-SiC-Whisker and Spinel-SiCWhisker Composites. Journal of the American Ceramic Society, 81: 1069–1070. doi:10.1111/j.1151-

    2916.1998.tb02452.x

    Dissertation and Thesis

    • H. M. Chizever, “Characterization of Anisotropic Materials using Scattered Field Measurements” (2021).

    Theses and Dissertations. 5072. https://scholar.afit.edu/etd/5072

    • H. M. Chizever, “Optimal extraction of scattering mechanisms from measured data” (1995). Graduate

    Theses and Dissertations. 2013. https://ecommons.udayton.edu/graduate_theses /2013

    Non-Peer Reviewed Conferences

    • M. Hyde, M. Havrilla and H. Chizever. “Permittivity and Permeability Errors Due to Misalignment and

    Phase Aberrations Using S21 with Angle Diversity in a Free-Space Measurement System.” Paper presented at the Material Measurement Working Group Meeting, Colorado Springs, CO, May 2015.

    • H. Chizever. “A Comparison between MMWG Artificial Lossy Dielectric Standard Measurements and

    CEM Predictions.” Paper presented at the Material Measurement Working Group Meeting, Colorado Springs, CO, May 2015.

    • J.A. Berrie, D.G. Kuhl, H.M. Chizever. “An Automated Slotted Line Dielectric Measurement System.”

    Paper presented at the Antenna Measurement Techniques Association Conference, 2003

    • J. Berrie, H. Chizever, B. Welsh, and G. Wilson. “Physics-Based Modeling of Target Signatures.” Paper

    presented at the Antenna Measurement Techniques Association Conference, 1998.

    • H. Chizever, R. Soerens and B. Kent. “On Reducing Primary Calibration Errors in Radar Cross Section

    Measurements.” Paper presented at the Antenna Measurement Techniques Association Conference, 1996.

    • D. Fleisch, P. Swetnam, H. Chizever and B. Kent. “A Combined Pulsed/CW and Pulsed-IF

    Instrumentation System.” Paper presented at the Antenna Measurement Techniques Association Conference, 1994

    H. Chizever, L. Suzuki, “A Squat Cylinder-Dihedral Dual Calibration Device for Compact Ranges at UHF,” Proc. Ant. Meas. Technique Assoc., Accepted for Publication. Seattle, WA, Oct. 2023.